Fan-Chi Hou

Simulation of oxide trapping noise in submicron n-channel MOSFETs

Fan-Chi Hou, G. Bosman, Mark E. Law · IEEE Transactions on Electron Devices · 2003 · 40 citations

Engineering, Electrical Engineering, Microelectronics +16

A Physical Understanding of RF Noise in Bulk nMOSFETs With Channel Lengths in the Nanometer Regime

Vinayak Mahajan, Pradeep Rao Patalay, Renuka Jindal et al. · IEEE Transactions on Electron Devices · 2011 · 27 citations

Engineering, Electrical Engineering, Microwave Engineering +16

Bulk defect induced low-frequency noise in n/sup +/-p silicon diodes

Fan-Chi Hou, G. Bosman, Eddy Simoen et al. · IEEE Transactions on Electron Devices · 1998 · 22 citations

Engineering, Electrical Engineering, Materials Science +17

Effect of Stress-Induced Degradation in LDMOS $\hbox{1}/f$ Noise Characteristics

Md. Iqbal Mahmud, P. H. Hao, P. Srinivasan et al. · IEEE Electron Device Letters · 2011 · 20 citations

Engineering, Electrical Engineering, Microelectronics +16

45nm low-power CMOS SoC technology with aggressive reduction of random variation for SRAM and analog transistors

S. Ekbote, K. Benaissa, B. Obradovic et al. · 2008 · 15 citations

Engineering, Computer Engineering, Electrical Engineering +17