Takafumi Fujisawa

Large-Scale Test Circuits for High-Speed and Highly Accurate Evaluation of Variability and Noise in Metal–Oxide–Semiconductor Field-Effect Transistor Electrical Characteristics

Yuki Kumagai, Kenichi Abe, Takafumi Fujisawa et al. · Japanese Journal of Applied Physics · 2011 · 22 citations

Device Modeling, Electrical Engineering, Semiconductor Device +12

Experimental Investigation of Effect of Channel Doping Concentration on Random Telegraph Signal Noise

Kenichi Abe, Akinobu Teramoto, Shunichi Watabe et al. · Japanese Journal of Applied Physics · 2010 · 20 citations

Semiconductor Technology, Electrical Engineering, Engineering +12

Quantitative study of surface relief induced in the martensitic transformation of a CuAlNi shape memory alloy by scanning tunneling microscopy

Masahiko Yamamoto, Takafumi Fujisawa, Toshio Saburi et al. · Surface Science · 1992 · 15 citations

Anomalous Random Telegraph Signal Extractions from a Very Large Number of n-Metal Oxide Semiconductor Field-Effect Transistors Using Test Element Groups with 0.47 Hz–3.0 MHz Sampling Frequency

Kenichi Abe, Takafumi Fujisawa, Akinobu Teramoto et al. · Japanese Journal of Applied Physics · 2009 · 13 citations

Electrical Engineering, Engineering, Measurement +13

Analysis of Hundreds of Time Constant Ratios and Amplitudes of Random Telegraph Signal with Very Large Scale Array Test Pattern

Takafumi Fujisawa, Kenichi Abe, Shunichi Watabe et al. · Japanese Journal of Applied Physics · 2010 · 12 citations

Electrical Engineering, Semiconductor Device, Engineering +15