Shunichi Watabe

Random Telegraph Signal Statistical Analysis using a Very Large-scale Array TEG with 1M MOSFETs

Kenichi Abe, S. Sugawa, Shunichi Watabe et al. · 2007 · 41 citations

Electrical Engineering, High Accuracy, Engineering +13

Large-Scale Test Circuits for High-Speed and Highly Accurate Evaluation of Variability and Noise in Metal–Oxide–Semiconductor Field-Effect Transistor Electrical Characteristics

Yuki Kumagai, Kenichi Abe, Takafumi Fujisawa et al. · Japanese Journal of Applied Physics · 2011 · 22 citations

Device Modeling, Electrical Engineering, Semiconductor Device +12

Experimental Investigation of Effect of Channel Doping Concentration on Random Telegraph Signal Noise

Kenichi Abe, Akinobu Teramoto, Shunichi Watabe et al. · Japanese Journal of Applied Physics · 2010 · 20 citations

Semiconductor Technology, Electrical Engineering, Engineering +12

A Test Structure for Statistical Evaluation of Characteristics Variability in a Very Large Number of MOSFETs

Shunichi Watabe, S. Sugawa, K. Abe et al. · 2009 · 16 citations

Reliability, Device Modeling, Electrical Engineering +15

Accurate Time Constant of Random Telegraph Signal Extracted by a Sufficient Long Time Measurement in Very Large-Scale Array TEG

T. Fujisawa, K. Abe, Shunichi Watabe et al. · 2009 · 14 citations

Time Constant, Electrical Engineering, Engineering +15