Max J. Schulz

The end of the road for silicon?

Max J. Schulz · Nature · 1999 · 315 citations

Engineering, Semiconductor Device Fabrication, Technology +4

Band offsets and electronic structure of SiC/SiO2 interfaces

V. V. Afanas’ev, Gerhard Pensl, Max J. Schulz et al. · Journal of Applied Physics · 1996 · 266 citations

Materials Science, Diamond-like Carbon, Electrical Engineering +11

Interface states on semiconductor/insulator surfaces

A. Goetzberger, E. Klausmann, Max J. Schulz · C R C Critical Reviews in Solid State Sciences · 1976 · 187 citations

Engineering, Semiconductors, Ii-vi Semiconductor +18

Shallow electron traps at the 4H–SiC/SiO2 interface

V. V. Afanas’ev, A. Stesmans, Gerhard Pensl et al. · Applied Physics Letters · 2000 · 142 citations

High Density, Semiconductor Technology, Electrical Engineering +10

Elimination of SiC/SiO2 interface states by preoxidation ultraviolet-ozone cleaning

V. V. Afanas’ev, A. Stesmans, Gerhard Pensl et al. · Applied Physics Letters · 1996 · 120 citations

Materials Science, Materials Engineering, Chemical Engineering +13