Statistics
Publications
15
Citations
777
H-Index
12
Active since
2001
Charles Joubert is an author at Université Claude Bernard Lyon 1 specializing in engineering, electrical engineering, and power electronics.
Publications per year
2001–2022
15
15
Gate Oxide Degradation of SiC MOSFET in Switching Conditions
Rémy Ouaida, Maxime Berthou, Javier León et al. · IEEE Electron Device Letters · 2014 · 131 citations
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