Liqun Han

Formation-Damage and Well-Productivity Simulation

Arild Lohne, Liqun Han, Claas van der Zwaag et al. · SPE Journal · 2010 · 42 citations

Engineering, Fluid Loss, Mechanical Engineering +20

Prospects for charged particle lithography as a manufacturing technology

R. F. W. Pease, Liqun Han, G. I. Winograd et al. · Microelectronic Engineering · 2000 · 19 citations

Materials Science, Engineering, Electron-beam Lithography +7

Electrical Properties of Nb-Doped SrTiO[sub 3] Ceramics with Excess TiO[sub 2] for SOFC Anodes and Interconnects

Fumimasa Horikiri, Liqun Han, Naofumi Iizawa et al. · Journal of The Electrochemical Society · 2007 · 15 citations

Materials Science, Materials Engineering, Electrical Engineering +13

Performance investigation of Coulomb interaction-limited high throughput electron beam lithography based on empirical modeling

Liqun Han, M. A. McCord, G. I. Winograd et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1998 · 13 citations

Engineering, Electron-beam Lithography, Microscopy +17

Formation Damage and Well Productivity Simulation

Arild Lohne, Liqun Han, Claas van der Zwaag et al. · 2009 · 12 citations

Engineering, Fluid Loss, Mechanical Engineering +21