Concepedia

Jongsin Yun

JY

Statistics

Publications

5

Citations

626

H-Index

5

Active since

2004

Affiliations

Siemens (United States)(Current)

Karlsruhe Institute of Technology

Texas Tech University

Jongsin Yun is an author at Siemens (United States) specializing in engineering, device characterization, and thermal modeling of thin films.

Publications per year

2004–2023

5

Publications

5

Ion-Enrichment and Ion-Depletion Effect of Nanochannel Structures

Qiaosheng Pu, Jongsin Yun, H. Temkin et al. · Nano Letters · 2004 · 524 citations

Natural Sciences, Chemical Engineering, Nanomaterials +12

Thin-Film Thermal Conductivity Measurement Using Microelectrothermal Test Structures and Finite-Element-Model-Based Data Analysis

Nenad Stojanović, Jongsin Yun, E.B.K. Washington et al. · Journal of Microelectromechanical Systems · 2007 · 70 citations

Engineering, Materials Engineering, Materials Science +17

MBIST Support for Reliable eMRAM Sensing

Jongsin Yun, Benoit Nadeau-Dostie, Martin Keim et al. · 2020 · 12 citations

Engineering, Computer Engineering, Electrical Engineering +17

MBIST-based Trim-Search Test Time Reduction for STT-MRAM

Christopher Münch, Jongsin Yun, Martin Keim et al. · 2022 · 10 citations

Engineering, Computer Engineering, Computer Science +13

Smart Hammering: A practical method of pinhole detection in MRAM memories

Sina Bakhtavari Mamaghani, Christopher Münch, Jongsin Yun et al. · 2023 · 10 citations

Engineering, Computer Engineering, Electrical Engineering +15

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