Ling Xia

Gate Current Degradation Mechanisms of GaN High Electron Mobility Transistors

Jungwoo Joh, Ling Xia, Jesús A. del Alamo · 2007 · 108 citations

Engineering, Electrical Engineering, Materials Science +17

State of Health Estimation for Lithium-Ion Battery Using Empirical Degradation and Error Compensation Models

Yuanyuan Jiang, Jie Zhang, Ling Xia et al. · IEEE Access · 2020 · 83 citations · Full text

Engineering, Chemical Engineering, Electrochemical Engineering +16

On reverse gate leakage current of GaN high electron mobility transistors on silicon substrate

Ling Xia, A.W. Hanson, Timothy Boles et al. · Applied Physics Letters · 2013 · 53 citations

Engineering, Electrical Engineering, Materials Science +17

A Fault Feature Extraction Method for DC–DC Converters Based on Automatic Hyperparameter-Optimized 1-D Convolution and Long Short-Term Memory Neural Networks

Yuanyuan Jiang, Ling Xia, Jie Zhang · IEEE Journal of Emerging and Selected Topics in Power Electronics · 2021 · 34 citations

Computing, Computer Science, Electrical Engineering +17

Hole mobility enhancement in In0.41Ga0.59Sb quantum-well field-effect transistors

Ling Xia, J.B. Boos, B. R. Bennett et al. · Applied Physics Letters · 2011 · 27 citations · Full text

Engineering, Electrical Engineering, Materials Science +17