Statistics
Publications
17
Citations
628
H-Index
14
Active since
2008
Jongwoo Park is an author at Samsung (South Korea) specializing in engineering, electrical engineering, and device characterization.
Publications per year
2008–2022
17
17
Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices
Soon Young Lee, Il-Gon Kim, Sungmock Ha et al. · 2015 · 73 citations
Engineering, Computer Engineering, Electrical Engineering +16
Cyber‐Physical Watermarking with Inkjet Edible Bioprinting
Hee‐Jae Jeon, Jung Woo Leem, Yuhyun Ji et al. · Advanced Functional Materials · 2022 · 60 citations · Full text
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