N. V. Nguyen

Microstructural evolution of ultrathin amorphous silicon films by real-time spectroscopic ellipsometry

Ilsin An, Hien V. Nguyen, N. V. Nguyen et al. · Physical Review Letters · 1990 · 67 citations

Natural Sciences, Materials Science, Physics +17

Error correction for calibration and data reduction in rotating-polarizer ellipsometry: applications to a novel multichannel ellipsometer

N. V. Nguyen, B. S. Pudliner, Ilsin An et al. · Journal of the Optical Society of America A · 1991 · 51 citations

Engineering, Chemistry, Photonics +14

Neutron reflectometry, x-ray reflectometry, and spectroscopic ellipsometry characterization of thin SiO2 on Si

Joseph A. Dura, Curt A. Richter, C. F. Majkrzak et al. · Applied Physics Letters · 1998 · 40 citations

Engineering, Materials Engineering, Materials Science +17

Ion-implantation induced anomalous surface amorphization in silicon

T. Lohner, E. Kótai, N.Q. Khánh et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1994 · 37 citations · Full text

Engineering, Materials Engineering, Materials Science +12

Facile Synthesis of a NiCo ₂ O ₄ Nanoparticles Mesoporous Carbon Composite as Electrode Materials for Supercapacitor

N. V. Nguyen, Thu Van Tran, Son T. Luong et al. · ChemistrySelect · 2020 · 37 citations

Natural Sciences, Materials Engineering, Materials Science +17