K. Tsuji

Highly reliable TaOx ReRAM and direct evidence of redox reaction mechanism

Zhiqiang Wei, Yuchi Kanzawa, K. Arita et al. · 2008 · 334 citations

Natural Sciences, Materials Engineering, Materials Science +16

An 8 Mb Multi-Layered Cross-Point ReRAM Macro With 443 MB/s Write Throughput

Akifumi Kawahara, Ryotaro Azuma, Yuuichirou Ikeda et al. · IEEE Journal of Solid-State Circuits · 2012 · 302 citations

Engineering, Computer Engineering, Electrical Engineering +15

Electrical and physical properties of ultrathin reoxidized nitrided oxides prepared by rapid thermal processing

Takashi Hori, Hiroshi Iwasaki, K. Tsuji · IEEE Transactions on Electron Devices · 1989 · 253 citations

Natural Sciences, Materials Engineering, Materials Science +17

An 8Mb multi-layered cross-point ReRAM macro with 443MB/s write throughput

Akifumi Kawahara, Ryotaro Azuma, Yuuichirou Ikeda et al. · 2012 · 139 citations

Engineering, Computer Engineering, Electrical Engineering +15

Charge-trapping properties of ultrathin nitrided oxides prepared by rapid thermal annealing

Takashi Hori, Hiroshi Iwasaki, K. Tsuji · IEEE Transactions on Electron Devices · 1988 · 88 citations

Natural Sciences, Materials Engineering, Materials Science +17