Byung-Hyun Lee

Comprehensive Analysis of Gate-Induced Drain Leakage in Vertically Stacked Nanowire FETs: Inversion-Mode Versus Junctionless Mode

Jae Hur, Byung-Hyun Lee, Min‐Ho Kang et al. · IEEE Electron Device Letters · 2016 · 90 citations

Device Modeling, Electrical Engineering, Engineering +12

GPS/DR Error Estimation for Autonomous Vehicle Localization

Byung-Hyun Lee, Jong‐Hwa Song, Jun-Hyuck Im et al. · Sensors · 2015 · 72 citations · Full text

Reliable Navigation Capabilities, Engineering, Location Estimation +12

Effect of Spoofing on Unmanned Aerial Vehicle using Counterfeited GPS Signal

Seong-Hun Seo, Byung-Hyun Lee, Sung-Hyuck Im et al. · Journal of Positioning Navigation and Timing · 2015 · 71 citations

Radar, Engineering, Global Positioning System +15

Nanoscale FET-Based Transduction toward Sensitive Extended-Gate Biosensors

Jae Hong Kwon, Byung-Hyun Lee, Seongyeon Kim et al. · ACS Sensors · 2019 · 42 citations

Sensitive Transducer, Engineering, Biosensing Systems +15

Local Electro-Thermal Annealing for Repair of Total Ionizing Dose-Induced Damage in Gate-All-Around MOSFETs

Jun-Young Park, Dong‐Il Moon, Hagyoul Bae et al. · IEEE Electron Device Letters · 2016 · 28 citations

Defect Tolerance, Electrical Engineering, Total Ionizing Dose +14