Jun-Young Park

Vertically Integrated Multiple Nanowire Field Effect Transistor

Byung-Hyun Lee, Min‐Ho Kang, Dae-Chul Ahn et al. · Nano Letters · 2015 · 67 citations

Non-volatile Memory, Electrical Engineering, Bulk Silicon Substrate +13

Degradation pattern prediction of a polymer electrolyte membrane fuel cell stack with series reliability structure via durability data of single cells

Suk Joo Bae, Seong‐Joon Kim, Jinhwa Lee et al. · Applied Energy · 2014 · 57 citations

Electrical Engineering, Engineering, Degradation Pattern Prediction +8

An Energy-Efficient and Scalable Deep Learning/Inference Processor With Tetra-Parallel MIMD Architecture for Big Data Applications

Seong‐Wook Park, Jun-Young Park, Kyeongryeol Bong et al. · IEEE Transactions on Biomedical Circuits and Systems · 2016 · 49 citations

Physically Transient Memory on a Rapidly Dissoluble Paper for Security Application

Hagyoul Bae, Byung-Hyun Lee, Dong Il Lee et al. · Scientific Reports · 2016 · 43 citations · Full text

Nano-electromechanical Switch Based on a Physical Unclonable Function for Highly Robust and Stable Performance in Harsh Environments

Kyuman Hwang, Jun-Young Park, Hagyoul Bae et al. · ACS Nano · 2017 · 42 citations

Engineering, Nanocomputing, Microactuator +17