Chuan-Wei Kuo

Hydrogen Diffusion and Threshold Voltage Shifts in Top-Gate Amorphous InGaZnO Thin-Film Transistors

Hong-Chih Chen, Jianjie Chen, Kuan‐Ju Zhou et al. · IEEE Transactions on Electron Devices · 2020 · 44 citations

Engineering, Electrical Engineering, Materials Science +17

Investigation of the Capacitance–Voltage Electrical Characteristics of Thin-Film Transistors Caused by Hydrogen Diffusion under Negative Bias Stress in a Moist Environment

Hong-Chih Chen, Chuan-Wei Kuo, Ting‐Chang Chang et al. · ACS Applied Materials & Interfaces · 2019 · 40 citations

Engineering, Electrical Engineering, Materials Science +17

A Novel Heat Dissipation Structure for Inhibiting Hydrogen Diffusion in Top-Gate a-InGaZnO TFTs

Hong-Chih Chen, Guan-Fu Chen, Po‐Hsun Chen et al. · IEEE Electron Device Letters · 2019 · 26 citations

Engineering, Electrical Engineering, Materials Science +17

Abnormal Hump Effect Induced by Hydrogen Diffusion During Self-Heating Stress in Top-Gate Amorphous InGaZnO TFTs

Hong-Chih Chen, Jianjie Chen, Yu‐Fa Tu et al. · IEEE Transactions on Electron Devices · 2020 · 25 citations

Engineering, Electrical Engineering, Materials Science +17

Inhibiting the Kink Effect and Hot-Carrier Stress Degradation Using Dual-Gate Low-Temperature Poly-Si TFTs

Hong-Chih Chen, Hong‐Yi Tu, Hui‐Chun Huang et al. · IEEE Electron Device Letters · 2019 · 14 citations

Engineering, Electrical Engineering, Materials Science +17