Statistics
Publications
2
Citations
54
H-Index
2
Active since
2003
Affiliations
IBM (United States)(Current)
Zhijian Yang is an author at IBM (United States) specializing in device reliability, hot-carrier degradation, and microelectronics.
Publications per year
2003–2003
2
2
SiGe HBT performance and reliability trends through f/sub T/ of 350 GHz
G. Freeman, Jae-Sung Rieh, B. Jagannathan et al. · 2003 · 22 citations
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