Daniel B. Jackson

Power considerations in the design of the Alpha 21264 microprocessor

M.K. Gowan, Larry Biro, Daniel B. Jackson · 1998 · 370 citations

Engineering, Computer Engineering, Electrical Engineering +17

Examination of gradual-junction p-MOS structures for hot carrier control using a new lifetime extraction method

B.S. Doyle, K. Mistry, Daniel B. Jackson · IEEE Transactions on Electron Devices · 1992 · 22 citations

Engineering, Electrical Engineering, Materials Science +17

Thermally generated electron traps in boron-implanted, phosphorus-doped silicon

Daniel B. Jackson, C. T. Sah · Journal of Applied Physics · 1985 · 15 citations

Engineering, Materials Engineering, Materials Science +17

AC hot carrier lifetimes in oxide and ROXNOX N-channel MOSFET's

K. Mistry, B.S. Doyle, Ara Philipossian et al. · 2002 · 12 citations

Engineering, Electrical Engineering, Materials Science +17

Performance degradation of n-channel MOS transistors during DC and pulsed Fowler-Nordheim stress

Bruce J. Fishbein, Daniel B. Jackson · 2002 · 10 citations

Engineering, Electrical Engineering, Electronic Materials +16