Y. Leng

Atomic ordering of GaInP studied by Kelvin probe force microscopy

Y. Leng, C. C. Williams, L. C. Su et al. · Applied Physics Letters · 1995 · 61 citations

Kpfm Contrast, Engineering, Microscopy +16

Mapping of mobile charges on insulator surfaces with the electrostatic force microscope

Karel Domanský, Y. Leng, C. C. Williams et al. · Applied Physics Letters · 1993 · 59 citations

Electrohydrodynamics, Engineering, Microscopy +21

CBC8: A 0.25 µm SiGe-CBiCMOS technology platform on thick-film SOI for high-performance analog and RF IC design

Jeff A. Babcock, Greg Cestra, Wibo van Noort et al. · 2010 · 17 citations

Complementary-sige Bicmos Technology, Electrical Engineering, C Pnp +14

Electrostatic characterization of biological and polymeric surfaces by electrostatic force microscopy

Y. Leng, C. C. Williams · Colloids and Surfaces A Physicochemical and Engineering Aspects · 1994 · 15 citations

Electroactive Material, Conducting Polymer, Electrohydrodynamics +9