Statistics
Publications
3
Citations
217
H-Index
3
Active since
2005
Affiliations
K.S. Abdel-Hafez is an author at Syntek Technologies (United States) specializing in design for testability, engineering, and scan design.
Publications per year
2005–2006
3
3
VirtualScan: a new compressed scan technology for test cost reduction
L.-T. Wang, Xiaoqing Wen, Hiroshi Furukawa et al. · 2005 · 105 citations · Full text
Engineering, Computer Engineering, Fault-tolerant Computing +12
A New ATPG Method for Efficient Capture Power Reduction During Scan Testing
Xiaoqing Wen, Seiji Kajihara, Kohei Miyase et al. · 2006 · 91 citations · Full text
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