Statistics
Publications
3
Citations
61
H-Index
3
Active since
2002
Affiliations
United Microelectronics (Taiwan)(Current)
J. R. Hwang is an author at United Microelectronics (Taiwan) specializing in applied physics, microelectronics, and engineering.
Publications per year
2002–2004
3
3
Performance of 70 nm strained-silicon CMOS devices
J. R. Hwang, J.H. Ho, S.M. Ting et al. · 2004 · 31 citations
Hot carrier degradation in novel strained-Si nMOSFETs
Meng Lu, S. Chiang, A. Liu et al. · 2004 · 19 citations
Electrical Engineering, Engineering, Hot Carrier Degradation +12
MOSFET Channel Engineering using Strained Si, SiGe, and Ge Channels
Eugene A. Fitzgerald, M. L. Lee, C. W. Leitz et al. · 2002 · 11 citations · Full text
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