Statistics
Publications
2
Citations
50
H-Index
2
Active since
2000
Affiliations
Y Kim is an author at University of Illinois Urbana-Champaign specializing in microelectronics, electrical engineering, and electronic materials.
Publications per year
2000–2015
2
2
The relentless march of the MOSFET gate oxide thickness to zero
G. Timp, J. Bude, F.H. Baumann et al. · Microelectronics Reliability · 2000 · 35 citations
Engineering, Electrical Engineering, Electronic Materials +13
1–2 of 2