W. T. Silfvast

Reduction imaging at 14 nm using multilayer-coated optics: Printing of features smaller than 0.1 μm

J. E. Bjorkholm, Jeffrey Bokor, L. Eichner et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1990 · 158 citations

Optical Materials, X-ray Spectroscopy, Engineering +23

SINGLE PASS GAIN OF EXCIPLEX 4-MU AND RHODAMINE 6G DYE LASER AMPLIFIERS

C. V. Shank, A. Dienes, W. T. Silfvast · Applied Physics Letters · 1970 · 131 citations

Optical Pumping, Engineering, Optical Amplifier +9

PHOTOINDUCED REFRACTIVE INDEX INCREASE IN POLY(METHYLMETHACRYLATE) AND ITS APPLICATIONS

W. J. Tomlinson, I. P. Kaminow, Edwin A. Chandross et al. · Applied Physics Letters · 1970 · 131 citations

Short Wavelength Optic, Optical Materials, Engineering +27

EFFICIENT CW LASER OSCILLATION AT 4416 Å IN Cd (II)

W. T. Silfvast · Applied Physics Letters · 1968 · 122 citations

Engineering, Laser Science, å In Cd +21

Intense xenon capillary discharge extreme-ultraviolet source in the 10–16-nm-wavelength region

Marc Klosner, W. T. Silfvast · Optics Letters · 1998 · 95 citations

Ultraviolet Light, Engineering, Glow Discharge +17