M. Aeberhard

Improved quantitative analysis of hard coatings by radiofrequency glow discharge optical emission spectrometry (rf?GD?OES)

Richard Payling, M. Aeberhard, Daniel Delfosse · Journal of Analytical Atomic Spectrometry · 2001 · 52 citations

Engineering, Glow Discharge, Dc Bias Voltage +21

Quantitative analysis of conductive coatings by radiofrequency‐powered glow discharge optical emission spectrometry: hydrogen, d.c. bias voltage and density corrections

Richard Payling, Johann Michler, M. Aeberhard · Surface and Interface Analysis · 2002 · 42 citations

Optical Materials, Engineering, Glow Discharge +20

Characterisation of a pulsed rf-glow discharge in view of its use in OES

Th. Nelis, M. Aeberhard, M. Hohl et al. · Journal of Analytical Atomic Spectrometry · 2005 · 34 citations

Engineering, Glow Discharge, Optical Emission Spectroscopy +20

Depth profiling by GDOES: application of hydrogen and d.c. bias voltage corrections to the analysis of thin oxide films

Johann Michler, M. Aeberhard, Dirk Velten et al. · Thin Solid Films · 2004 · 23 citations

Surface Characterization, Electrical Engineering, Engineering +9

Modelling the RF source in GDOES

Richard Payling, Olivier Bonnot, E. Fretel et al. · Journal of Analytical Atomic Spectrometry · 2003 · 15 citations

Electrical Engineering, Rf Source, Engineering +14