M. Hohl

High Spatial Resolution Time-of-Flight Secondary Ion Mass Spectrometry for the Masses: A Novel Orthogonal ToF FIB-SIMS Instrument with<i>In Situ</i>AFM

J. A. Whitby, Fredrik Östlund, Péter Horváth et al. · Advances in Materials Science and Engineering · 2011 · 81 citations · Full text

Microscopy, Biological Mass Spectrometry, Ion Beam Instrumentation +17

Pulsed r.f.‐glow‐discharge time‐of‐flight mass spectrometry for fast surface and interface analysis of conductive and non‐conductive materials

M. Hohl, A. Kanzari, Johann Michler et al. · Surface and Interface Analysis · 2006 · 64 citations

Engineering, Glow Discharge, Biological Mass Spectrometry +22

A comparison of non-pulsed radiofrequency and pulsed radiofrequency glow discharge orthogonal time-of-flight mass spectrometry for analytical purposes

Lara Lobo, Jorge Pisonero, Nerea Bordel et al. · Journal of Analytical Atomic Spectrometry · 2009 · 53 citations · Full text

Engineering, Atomic Emission Spectroscopy, Pulsed Radiofrequency +21

The concept of plasma cleaning in glow discharge spectrometry

I. S. Molchan, G.E. Thompson, P. Skeldon et al. · Journal of Analytical Atomic Spectrometry · 2009 · 43 citations · Full text

DESIGN AND PERFORMANCE OF TWO ORTHOGONAL EXTRACTION TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETERS FOR FOCUSED ION BEAM INSTRUMENTS

Deborah Alberts, Leandro von Werra, Fredrik Oestlund et al. · Instrumentation Science & Technology · 2014 · 35 citations

Measurement, Microscopy, Biological Mass Spectrometry +17