M.H. Wang

High resolution electron microscopy of amorphous interlayers between metal thin films and silicon

L.J. Chen, Jhe-Yu Lin, T.L. Lee et al. · Microscopy Research and Technique · 1998 · 46 citations

Effects of silicide formation on the removal of end-of-range ion implantation damage in silicon

W. Lur, Jay Cheng, C. H. Chu et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1989 · 19 citations

Ion Implantation, Engineering, Applied Physics +6

Determination of Ultratrace Amounts of Copper and Cadmium in Seawater by Graphite Furnace Atomic Absorption Spectrometry with Flow-Injection Semi On-line Preconcentration

M.H. Wang, Alexander I. Yuzefovsky, Robert G. Michel · Microchemical Journal · 1993 · 14 citations

Environmental Chemistry, Engineering, Environmental Engineering +7

High-resolution transmission electron microscopy investigation of interfaces in metal-silicon systems

L.J. Chen, J.M. Liang, C.S. Liu et al. · Ultramicroscopy · 1994 · 10 citations

Engineering, Electron Microscopy, Physics +8