Publication | Closed Access
High-resolution transmission electron microscopy investigation of interfaces in metal-silicon systems
10
Citations
19
References
1994
Year
EngineeringElectron MicroscopyPhysicsMicroscopyScanning Probe MicroscopySurface ScienceApplied PhysicsSemiconductor Device FabricationSilicon On InsulatorMetal-silicon SystemsInterface Structure
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