Xintian Zhou

A Simulation-Based Comparison Between Si and SiC MOSFETs on Single-Event Burnout Susceptibility

Xintian Zhou, Yunpeng Jia, Dongqing Hu et al. · IEEE Transactions on Electron Devices · 2019 · 103 citations

Engineering, Buffer Layer, Integrated Circuits +19

Investigations on the Degradation of 1.2-kV 4H-SiC MOSFETs Under Repetitive Short-Circuit Tests

Xintian Zhou, Hongyuan Su, Yan Wang et al. · IEEE Transactions on Electron Devices · 2016 · 87 citations

Electrical Engineering, 1.2-Kv 4H-sic Mosfets, Engineering +13

A Deep Insight Into the Degradation of 1.2-kV 4H-SiC mosfets Under Repetitive Unclamped Inductive Switching Stresses

Xintian Zhou, Hongyuan Su, Ruifeng Yue et al. · IEEE Transactions on Power Electronics · 2017 · 78 citations

Sub Xmlns, Engineering, Deep Insight Into +16

4H-SiC Trench MOSFET With Floating/Grounded Junction Barrier-controlled Gate Structure

Xintian Zhou, Ruifeng Yue, Jian Zhang et al. · IEEE Transactions on Electron Devices · 2017 · 69 citations

Semiconductor Technology, Electrical Engineering, Trench Mosfet +7

SiC Double-Trench MOSFETs With Embedded MOS-Channel Diode

Xintian Zhou, Haoyang Pang, Yunpeng Jia et al. · IEEE Transactions on Electron Devices · 2020 · 58 citations

Semiconductor Technology, Electrical Engineering, Semiconductor Device +14