Yunpeng Jia - Concepedia

Author

Yunpeng Jia

Beijing University of Technology

Also Known As

Jia Yun-peng, Jia Yunpeng, Jia, Yunpeng, Y.P. Jia, Yingchen Jia, Yun-Peng Jia, Yunpeng Jia

Publications

688

Citations

H-Index

Concepts

All Affiliations

Beijing University of Technology Beijing Microelectronics Technology Institute The University of Texas at Austin Xidian University

About

Yunpeng Jia is an author at Beijing University of Technology specializing in engineering, microelectronics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	14	16	566
2	Applied Physics	9	9	334
3	Natural Sciences	1	1	18
4	Civil Engineering	1	1	18
5	Computer Engineering	1	1	54

Yunpeng Jia

Publications

606

Citations

H-Index

Page 1

	Year	Citations
A Simulation-Based Comparison Between Si and SiC MOSFETs on Single-Event Burnout Susceptibility Xintian Zhou, Yunpeng Jia, Dongqing Hu, IEEE Transactions on Electron Devices EngineeringBuffer LayerIntegrated CircuitsPower ElectronicsSilicon On Insulator	2019	103
SiC Double-Trench MOSFETs With Embedded MOS-Channel Diode Xintian Zhou, Haoyang Pang, Yunpeng Jia, IEEE Transactions on Electron Devices Semiconductor TechnologyElectrical EngineeringSemiconductor DeviceEngineeringParasitic Body Diode	2020	58
Impact of Different Gate Biases on Irradiation and Annealing Responses of SiC MOSFETs Dongqing Hu, Jingwei Zhang, Yunpeng Jia, IEEE Transactions on Electron Devices Semiconductor TechnologyElectrical EngineeringSemiconductor DeviceEngineeringPostirradiation Annealing	2018	57
Single-Event Effects in SiC Double-Trench MOSFETs Xintian Zhou, Yun Tang, Yunpeng Jia, IEEE Transactions on Nuclear Science Hardware SecurityElectrical EngineeringSentaurus Tcad ToolsEngineeringPower Device	2019	54
SiC Planar MOSFETs With Built-In Reverse MOS-Channel Diode for Enhanced Performance Xintian Zhou, Hao Gong, Yunpeng Jia, IEEE Journal of the Electron Devices Society Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringSic Planar Mosfets	2020	45
A Real Case of Implementation of the Future 5G City Dania Marabissi, Lorenzo Mucchi, Romano Fantacci, Future Internet 5G NetworksWireless CommunicationsFuture 5GField Trial EnvironmentVertical Business	2018	43
Gate Oxide Damage of SiC MOSFETs Induced by Heavy-Ion Strike Xintian Zhou, Haoyang Pang, Yunpeng Jia, IEEE Transactions on Electron Devices Electrical EngineeringIon ImplantationEngineeringSemiconductor DeviceGate Oxide Damage	2021	34
Gate Bias Dependence of <i>V</i> <sub>TH</sub> Degradation in Planar and Trench SiC MOSFETs Under Repetitive Short Circuit Tests Yuan Li, Xintian Zhou, Yuanfu Zhao, IEEE Transactions on Electron Devices Semiconductor TechnologyElectrical EngineeringReliability EngineeringEngineeringSemiconductor Device	2022	30
Evaluation and Analysis of Temperature-Dependent Dynamic $R_{{{\mathrm{DS}}},{{\mathrm{ON}}}}$ of GaN Power Devices Considering High-Frequency Operation Yuan Li, Yunpeng Jia, Yunlong He, IEEE Journal of Emerging and Selected Topics in Power Electronics Electrical EngineeringEngineeringPower DeviceApplied PhysicsGan Devices	2019	24
Degradation of Radiation-Hardened Vertical Double-Diffused Metal-Oxide-Semiconductor Field-Effect Transistor During Gamma Ray Irradiation Performed After Heavy Ion Striking Xinyu Li, Yunpeng Jia, Xintian Zhou, IEEE Electron Device Letters Single Event EffectElectrical EngineeringCombined ImpactEngineeringIon Implantation	2019	24

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