Rainer Kassing

Deep Level Transient Fourier Spectroscopy (DLTFS)—A technique for the analysis of deep level properties

Sharon M. Weiss, Rainer Kassing · Solid-State Electronics · 1988 · 358 citations

Deep Level Properties, Physics, —A Technique +8

Recent results in cubic boron nitride deposition in light of the sputter model

S. Reinke, M. Kuhr, W. Kulisch et al. · Diamond and Related Materials · 1995 · 143 citations

Materials Engineering, Materials Science, Boron Nitride +9

Multipurpose sensor tips for scanning near-field microscopy

Ch. Mihalcea, W. Scholz, S. Werner et al. · Applied Physics Letters · 1996 · 113 citations

Engineering, Microscopy, Mechanical Engineering +18

Scanning force microscopy with micromachined silicon sensors

M. Nonnenmacher, J. Greschner, Olaf Wolter et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1991 · 112 citations

Sfm Measurements, Engineering, Microscopy +19

Determination of preferential binding sites for anti-dsRNA antibodies on double-stranded RNA by scanning force microscopy

Michael von Bonin, Jürgen Oberstraß, Noémi Lukács et al. · RNA · 2000 · 109 citations

Engineering, Immunology, Molecular Biology +18