Balu Pathangey

The measurement of deep level states caused by misfit dislocations in InGaAs/GaAs grown on patterned GaAs substrates

G. P. Watson, D. G. Ast, Timothy J. Anderson et al. · Journal of Applied Physics · 1992 · 61 citations

Engineering, Optoelectronic Devices, Semiconductor Device +16

MOCVD growth of non-epitaxial and epitaxial ZnS thin films

J. Fang, Paul H. Holloway, Jianguo Yu et al. · Applied Surface Science · 1993 · 49 citations

Materials Science, Engineering, Mocvd Growth +4

Evaluation of Zn{N[Si(CH3)3]2}2 as ap-type dopant in OMVPE growth of ZnSe

W.S. Rees, D. M. Green, Travis J. Anderson et al. · Journal of Electronic Materials · 1992 · 26 citations

Materials Engineering, Inorganic Chemistry, Materials Science +8

Lead-Free Solder Joint Void Evolution During Multiple Subsequent High-Temperature Reflows

Yan Li, Jeffrey S. Moore, Balu Pathangey et al. · IEEE Transactions on Device and Materials Reliability · 2012 · 22 citations

Materials Science, Materials Engineering, Engineering +15

Comparison of plasma chemistries for dry etching thin film electroluminescent display materials

J. W. Lee, Balu Pathangey, Mark R. Davidson et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1998 · 15 citations

Engineering, Plasma Processing, Chemical Engineering +17