D.M. Kim

Characteristics of the Series Resistance Extracted From Si Nanowire FETs Using the $Y$-Function Technique

Rock‐Hyun Baek, Chang‐Ki Baek, Sungwoo Jung et al. · IEEE Transactions on Nanotechnology · 2009 · 32 citations

Engineering, Electrical Engineering, Materials Science +17

Quantum C-V modeling in depletion and inversion: accurate extraction of electrical thickness of gate oxide in deep submicron MOSFETs

Wu-yun Quan, D.M. Kim, Hi‐Deok Lee · IEEE Transactions on Electron Devices · 2002 · 16 citations

Engineering, Electrical Engineering, Microelectronics +16

Simultaneous hot-hole injection at drain and source for efficient erase and excellent endurance in SONOS flash EEPROM cells

Myung Kwan Cho, D.M. Kim · IEEE Electron Device Letters · 2003 · 12 citations

Engineering, Computer Engineering, Electrical Engineering +16

Electrode–Molecule Interface Effects on Molecular Conductance

P. Tarakeshwar, J. J. Palacios, D.M. Kim · IEEE Transactions on Nanotechnology · 2008 · 12 citations

Natural Sciences, Chemistry, Physics +17