L.S. Driscoll

A model for capacitance reconstruction from measured lossy MOS capacitance voltage characteristics

K.S.K. Kwa, Sanatan Chattopadhyay, Nebojša Janković et al. · Semiconductor Science and Technology · 2002 · 104 citations

Device Modeling, Semiconductor Technology, Electrical Engineering +12

High-performance nMOSFETs using a novel strained Si/SiGe CMOS architecture

Sarah H. Olsen, A.G. O’Neill, L.S. Driscoll et al. · IEEE Transactions on Electron Devices · 2003 · 86 citations

Electrical Engineering, Semiconductor Device, Engineering +10

C–V characterization of strained Si/SiGe multiple heterojunction capacitors as a tool for heterojunction MOSFET channel design

Sanatan Chattopadhyay, K.S.K. Kwa, Sarah H. Olsen et al. · Semiconductor Science and Technology · 2003 · 34 citations

Electrical Engineering, Cmos Devices, Engineering +8

Study of Single- and Dual-Channel Designs for High-Performance Strained-Si–SiGe n-MOSFETs

Sarah H. Olsen, A.G. O’Neill, Sanatan Chattopadhyay et al. · IEEE Transactions on Electron Devices · 2004 · 34 citations

Electrical Engineering, Engineering, Nanoelectronics +10

Study of strain relaxation in Si/SiGe metal-oxide-semiconductor field-effect transistors

Sarah H. Olsen, A.G. O’Neill, P. Dobrosz et al. · Journal of Applied Physics · 2005 · 31 citations

Electrical Engineering, Engineering, Stress-induced Leakage Current +9