G. Strof

Vertically stacked nanowire MOSFETs for sub-10nm nodes: Advanced topography, device, variability, and reliability simulations

M. Karner, O. Baumgartner, Zlatan Stanojević et al. · 2016 · 35 citations

Engineering, Computer Engineering, Electrical Engineering +17

Nano Device Simulator—A Practical Subband-BTE Solver for Path-Finding and DTCO

Zlatan Stanojević, Chen-Ming Tsai, G. Strof et al. · IEEE Transactions on Electron Devices · 2021 · 27 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

Effect of Mask Geometry Variation on Plasma Etching Profiles

Josip Bobinac, Tobias Reiter, Julius Piso et al. · Micromachines · 2023 · 26 citations · Full text

Engineering, Electrical Engineering, Materials Engineering +17

Cell Designer - a Comprehensive TCAD-Based Framework for DTCO of Standard Logic Cells

Zlatan Stanojević, G. Strof, F. Schanovsky et al. · 2018 · 10 citations

Engineering, Computer Engineering, Electrical Engineering +17

Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies

G. Rzepa, M. Karner, O. Baumgartner et al. · 2021 · 10 citations

Engineering, Computer Engineering, Electrical Engineering +14