Hyuck‐In Kwon

Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

Jeong‐Min Lee, In-Tak Cho, Jong‐Ho Lee et al. · Applied Physics Letters · 2008 · 558 citations

Engineering, Electrical Engineering, Materials Science +17

Charge trapping and detrapping characteristics in amorphous InGaZnO TFTs under static and dynamic stresses

In-Tak Cho, Jeong‐Min Lee, Jong‐Ho Lee et al. · Semiconductor Science and Technology · 2008 · 115 citations

Engineering, Electrical Engineering, Materials Science +17

One-step solvothermal synthesis of carnation flower-like SnS 2 as superior electrodes for supercapacitor applications

Rajneesh Kumar Mishra, Geun Woo Baek, Kyuwon Kim et al. · Applied Surface Science · 2017 · 112 citations

Natural Sciences, Chemistry, Materials Science +13

Comparative study of electrical instabilities in top-gate InGaZnO thin film transistors with Al2O3 and Al2O3/SiNx gate dielectrics

Jeong‐Min Lee, In-Tak Cho, Jong‐Ho Lee et al. · Applied Physics Letters · 2009 · 106 citations

Engineering, Electrical Engineering, Materials Science +17

Impact of Oxygen Flow Rate on the Instability Under Positive Bias Stresses in DC-Sputtered Amorphous InGaZnO Thin-Film Transistors

Sung‐Chul Kim, Yong Woo Jeon, Yongsik Kim et al. · IEEE Electron Device Letters · 2011 · 75 citations

Engineering, Electrical Engineering, Materials Science +17