In-Tak Cho

Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

Jeong‐Min Lee, In-Tak Cho, Jong‐Ho Lee et al. · Applied Physics Letters · 2008 · 551 citations

Threshold Voltage Instabilities, Electrical Engineering, Semiconductor Device +11

Charge trapping and detrapping characteristics in amorphous InGaZnO TFTs under static and dynamic stresses

In-Tak Cho, Jeong‐Min Lee, Jong‐Ho Lee et al. · Semiconductor Science and Technology · 2008 · 112 citations

Engineering, Thin Film Process Technology, Dynamic Stresses +18

Comparative study of electrical instabilities in top-gate InGaZnO thin film transistors with Al2O3 and Al2O3/SiNx gate dielectrics

Jeong‐Min Lee, In-Tak Cho, Jong‐Ho Lee et al. · Applied Physics Letters · 2009 · 105 citations

Materials Science, Electrical Engineering, Semiconductor Device +12

Low-Frequency Noise in Amorphous Indium–Gallium–Zinc-Oxide Thin-Film Transistors

Jeong‐Min Lee, Woo‐Seok Cheong, Chi‐Sun Hwang et al. · IEEE Electron Device Letters · 2009 · 57 citations

Semiconductor Technology, Electrical Engineering, Engineering +10

Improvement of Long-Term Durability and Bias Stress Stability in p-Type SnO Thin-Film Transistors Using a SU-8 Passivation Layer

Youngjoon Han, Yong-Jin Choi, In-Tak Cho et al. · IEEE Electron Device Letters · 2014 · 56 citations

Sno Tfts, Engineering, Organic Electronics +19