Jeong‐Min Lee

Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

Jeong‐Min Lee, In-Tak Cho, Jong‐Ho Lee et al. · Applied Physics Letters · 2008 · 558 citations

Engineering, Electrical Engineering, Materials Science +17

Charge trapping and detrapping characteristics in amorphous InGaZnO TFTs under static and dynamic stresses

In-Tak Cho, Jeong‐Min Lee, Jong‐Ho Lee et al. · Semiconductor Science and Technology · 2008 · 115 citations

Engineering, Electrical Engineering, Materials Science +17

Comparative study of electrical instabilities in top-gate InGaZnO thin film transistors with Al2O3 and Al2O3/SiNx gate dielectrics

Jeong‐Min Lee, In-Tak Cho, Jong‐Ho Lee et al. · Applied Physics Letters · 2009 · 106 citations

Engineering, Electrical Engineering, Materials Science +17

Inherently Area‐Selective Atomic Layer Deposition of SiO₂ Thin Films to Confer Oxide Versus Nitride Selectivity

Jinseon Lee, Jeong‐Min Lee, Hongjun Oh et al. · Advanced Functional Materials · 2021 · 67 citations

Natural Sciences, Materials Engineering, Materials Science +17

Low-Frequency Noise in Amorphous Indium–Gallium–Zinc-Oxide Thin-Film Transistors

Jeong‐Min Lee, Woo‐Seok Cheong, Chi‐Sun Hwang et al. · IEEE Electron Device Letters · 2009 · 58 citations

Engineering, Electrical Engineering, Physics +17