G.D.J. Smit - Concepedia

Author

G.D.J. Smit

Also Known As

D. J. Geert Smit, G. D. J. Smit, G.D.J Smit, G.D.J. Smit, Geert D J Smit, Geert D. J. Smit, Geert D.J. Smit, Gert-Jan Smit, Smit, G. D. J.

Publications

1.3K

Citations

H-Index

Concepts

All Affiliations

NXP (Netherlands)Philips (Netherlands)Arizona State University IBM (United States)Philips (Finland)

About

G.D.J. Smit is an author at NXP (Netherlands) specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	17	24	1.1K
2	Applied Physics	13	13	708
3	Computer Engineering	11	11	741
4	Natural Sciences	1	1	33
5	Computer Science	1	1	95

G.D.J. Smit

Publications

1.1K

Citations

H-Index

Page 1

	Year	Citations
PSP: An Advanced Surface-Potential-Based MOSFET Model for Circuit Simulation G. Gildenblat, Xiaoyue Li, Weimin Wu, IEEE Transactions on Electron Devices EngineeringPower ElectronicsSemiconductor DeviceAdvanced Surface-potential-based ModelNanoelectronics	2006	400
Best Practices for Compact Modeling in Verilog-A Colin C. McAndrew, Geoffrey J. Coram, K.K. Gullapalli, IEEE Journal of the Electron Devices Society Hardware ModelingEngineeringHardware Verification LanguageModeling MethodComputer Architecture	2015	95
Experimental assessment of self-heating in SOI FinFETs A.J. Scholten, G.D.J. Smit, Ralf Pijper, Device ModelingElectrical EngineeringEngineeringTemperature RiseBias Temperature Instability	2009	93
RF-Noise Modeling in Advanced CMOS Technologies G.D.J. Smit, A.J. Scholten, Ralf Pijper, IEEE Transactions on Electron Devices EngineeringAnalog DesignExcess NoiseRf Circuit DesignRf-noise Modeling	2013	54
The Physical Background of JUNCAP2 A.J. Scholten, G.D.J. Smit, Marianne Durand, IEEE Transactions on Electron Devices Device ModelingElectrical EngineeringEngineeringCircuit SystemNanoelectronics	2006	41
The New CMC Standard Compact MOS Model PSP: Advantages for RF Applications A.J. Scholten, G.D.J. Smit, Bart A. De Vries, IEEE Journal of Solid-State Circuits EngineeringRadio FrequencyPsp ModelCircuit SystemNanoelectronics	2009	38
Benchmark Tests for MOSFET Compact Models With Application to the PSP Model Xin Li, Weimin Wu, Amit Jha, IEEE Transactions on Electron Devices EngineeringVlsi DesignPower ElectronicsPsp ModelCircuit System	2009	38
The Relation Between Degradation Under DC and RF Stress Conditions A.J. Scholten, Daniel Stephens, G.D.J. Smit, IEEE Transactions on Electron Devices Rf Stress ConditionsElectrical EngineeringReliability EngineeringEngineeringRf Semiconductor	2011	36
A Unified Nonquasi-Static MOSFET Model for Large-Signal and Small-Signal Simulations Hai Wang, Xiaoyue Li, Weimin Wu, IEEE Transactions on Electron Devices Numerical AnalysisNew FormulationEngineeringPower ElectronicsElectromagnetic Compatibility	2006	35
Gate-induced ionization of single dopant atoms G.D.J. Smit, Sven Rogge, J. Caro, Physical review. B, Condensed matter Quantum ScienceElectrical EngineeringIon ImplantationEngineeringSemiconductor Device	2003	33

Page 1