Publication | Closed Access
Experimental assessment of self-heating in SOI FinFETs
93
Citations
5
References
2009
Year
Unknown Venue
Device ModelingElectrical EngineeringEngineeringTemperature RiseBias Temperature InstabilityThermal TransportThermal ManagementSoi FinfetsFinfet OperationThermal ModelingThermodynamicsHeat TransferGigantic EffectMicroelectronicsThermal Engineering
In this paper, it is shown that self-heating causes a gigantic effect on the capacitances of MOSFETs/FinFETs. The effect is used to determine the SOI FinFET thermal impedance and to determine the temperature rise during FinFET operation.
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