Z. Gao

Microwave and Millimeter-Wave GaN HEMTs: Impact of Epitaxial Structure on Short-Channel Effects, Electron Trapping, and Reliability

Enrico Zanoni, Carlo De Santi, Z. Gao et al. · IEEE Transactions on Electron Devices · 2023 · 33 citations · Full text

Wide-bandgap Semiconductor, Electrical Engineering, Millimeter-wave Gan Hemts +13

Thermal and Electrical Stability Assessment of AlGaN/GaN Metal–Oxide–Semiconductor High-Electron Mobility Transistors (MOS-HEMTs) With HfO₂ Gate Dielectric

Z. Gao, M. F. Romero, F. Calle · IEEE Transactions on Electron Devices · 2018 · 21 citations · Full text

Semiconductors, Wide-bandgap Semiconductor, Electrical Engineering +10

Thermal Assessment of AlGaN/GaN MOS-HEMTs on Si Substrate Using Gd₂O₃ as Gate Dielectric

Z. Gao, M. F. Romero, María Ángela Pampillón Arce et al. · IEEE Transactions on Electron Devices · 2016 · 20 citations

Semiconductor Technology, Wide-bandgap Semiconductor, Electrical Engineering +15

Effects of Gd₂O₃ Gate Dielectric on Proton-Irradiated AlGaN/GaN HEMTs

Z. Gao, M. F. Romero, A. Redondo‐Cubero et al. · IEEE Electron Device Letters · 2017 · 20 citations · Full text

Semiconductors, Semiconductor Technology, Electrical Engineering +11

Small sample theory for reliability design

Jun Xiong, R.A. Shenoi, Z. Gao · The Journal of Strain Analysis for Engineering Design · 2002 · 15 citations

Small Sample Theory, Engineering, Population Standard Deviation +19