H. Asai

Tolerance Against Terrestrial Neutron-Induced Single-Event Burnout in SiC MOSFETs

H. Asai, I. Nashiyama, Kenji Sugimoto et al. · IEEE Transactions on Nuclear Science · 2014 · 87 citations

Electrical Engineering, Engineering, Power Device +10

Hardness-by-design approach for 0.15 /spl mu/m fully depleted CMOS/SOI digital logic devices with enhanced SEU/SET immunity

A. Makihara, M. Midorikawa, Tatsuya Yamaguchi et al. · IEEE Transactions on Nuclear Science · 2005 · 52 citations

Hardware Security, Low-power Electronics, Electrical Engineering +14

Terrestrial Neutron-Induced Single-Event Burnout in SiC Power Diodes

H. Asai, Kenji Sugimoto, I. Nashiyama et al. · IEEE Transactions on Nuclear Science · 2012 · 51 citations

Electrical Engineering, Engineering, Power Device +9

Evaluation of the White Neutron Beam Spectrum for Single-Event Effects Testing at the RCNP Cyclotron Facility

Yosuke Iwamoto, M. Fukuda, Yukio Sakamoto et al. · Nuclear Technology · 2011 · 41 citations

Engineering, Nuclear Physics, Nuclear Data +20

Optimization for SEU/SET Immunity on 0.15 $\mu$m Fully Depleted CMOS/SOI Digital Logic Devices

A. Makihara, Tatsuya Yamaguchi, H. Asai et al. · IEEE Transactions on Nuclear Science · 2006 · 27 citations

Electrical Engineering, Engineering, Vlsi Design +9