Concepedia

Terrestrial Neutron-Induced Single-Event Burnout in SiC Power Diodes

H. Asai, Kenji Sugimoto, I. Nashiyama, Yoshiya Iide, Kensuke Shiba, Mieko Matsuda, Yoshio Miyazaki

IEEE Transactions on Nuclear Science · 2012 · 51 citations · 12 references

DOI

Concepts

Abstract

Tolerance against single-event burnout (SEB) caused by terrestrial neutrons is one of the urgent issues in practical application of SiC power devices. This paper presents evaluation results of neutron-induced SEB in SiC power diodes and differences between SiC and Si devices from the SEB standpoint.

References

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