Yoshiya Iide

Hardness-by-design approach for 0.15 /spl mu/m fully depleted CMOS/SOI digital logic devices with enhanced SEU/SET immunity

A. Makihara, M. Midorikawa, Tatsuya Yamaguchi et al. · IEEE Transactions on Nuclear Science · 2005 · 53 citations

Engineering, Computer Engineering, Electrical Engineering +15

Terrestrial Neutron-Induced Single-Event Burnout in SiC Power Diodes

H. Asai, Kenji Sugimoto, I. Nashiyama et al. · IEEE Transactions on Nuclear Science · 2012 · 51 citations

Engineering, Electrical Engineering, Materials Science +7

Single-event effects in 0.18 /spl mu/m CMOS commercial processes

A. Makihara, Y. Sakaide, Y. Tsuchiya et al. · IEEE Transactions on Nuclear Science · 2003 · 22 citations

Engineering, Computer Engineering, Electrical Engineering +17

SEE in a 0.15 /spl mu/m fully depleted CMOS/SOI commercial Process

A. Makihara, Tatsuya Yamaguchi, Y. Tsuchiya et al. · IEEE Transactions on Nuclear Science · 2004 · 13 citations

Engineering, Electrical Engineering, Microelectronics +16

Design and development status of the EarthCARE Cloud Profiling Radar

Hirotaka Nakatsuka, Toshiyoshi Kimura, Y. Seki et al. · 2012 · 13 citations

Natural Sciences, Earth Sciences, Electrical Engineering +14