Toshiei Kurosaki is an author at Hitachi (Japan) specializing in instrumentation, computational optical imaging, and optical metrology.
Top concepts
Microscopy3D PrintingEngineeringInterferometryInstrumentationOptical SystemsOptical MetrologyDigital HolographyComputational ImagingComputational Optical Imaging
Publications per year
1987–1990
3
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1–3 of 3