Concepedia

Nihit Chattar

NC

3

Publications

76

Citations

3

H-Index

2009

Active since

Affiliations

Applied Materials (United States)(Current)

Indian Institute of Technology Bombay

Nihit Chattar is an author at Applied Materials (United States) specializing in microelectronics, electrical engineering, and computer engineering.

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Publications per year

2009–2010

3

Publications

3

Effect of SiN on Performance and Reliability of Charge Trap Flash (CTF) Under Fowler–Nordheim Tunneling Program/Erase Operation

C. Sandhya, Udayan Ganguly, Nihit Chattar et al. · IEEE Electron Device Letters · 2009 · 36 citations

, , +9

Impact of SiN Composition Variation on SANOS Memory Performance and Reliability Under nand (FN/FN) Operation

C. Sandhya, Apoorva B. Oak, Nihit Chattar et al. · IEEE Transactions on Electron Devices · 2009 · 30 citations

, , +16

Study of P/E Cycling Endurance Induced Degradation in SANOS Memories Under NAND (FN/FN) Operation

C. Sandhya, Apoorva B. Oak, Nihit Chattar et al. · IEEE Transactions on Electron Devices · 2010 · 10 citations

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