K. Jobe

Application of RHBD Techniques to SEU Hardening of Third-Generation SiGe HBT Logic Circuits

Ramkumar Krithivasan, Paul W. Marshall, Mustayeen B. Nayeem et al. · IEEE Transactions on Nuclear Science · 2006 · 49 citations

Engineering, Computer Engineering, Electrical Engineering +13

Simulation of SEE-induced charge collection in UHV/CVD SiGe HBTs

Guofu Niu, John D. Cressler, M. Shoga et al. · IEEE Transactions on Nuclear Science · 2000 · 49 citations

Engineering, Electrical Engineering, Materials Science +17

Correlation of Prediction to On-Orbit SEU Performance for a Commercial 0.25-$\mu$m CMOS SRAM

D. L. Hansen, K. Jobe, J. Whittington et al. · IEEE Transactions on Nuclear Science · 2007 · 34 citations

Engineering, Aerospace Engineering, Computer Engineering +15

Ion-microbeam probe of high-speed shift registers for SEE Analysis-part I: SiGe

Pao‐Hsien Chu, D. L. Hansen, B.L. Doyle et al. · IEEE Transactions on Nuclear Science · 2006 · 28 citations

Engineering, Computer Engineering, Electrical Engineering +15

Single event upset at gigahertz frequencies

M. Shoga, K. Jobe, M. Glasgow et al. · IEEE Transactions on Nuclear Science · 1994 · 27 citations

Engineering, Computer Engineering, Electrical Engineering +10