M. Stopka - Concepedia

Author

M. Stopka

University of Kassel

Also Known As

M. Stopka, Michael Stopka

Publications

268

Citations

H-Index

Concepts

All Affiliations

University of Kassel Carl Zeiss (Germany)Fraunhofer Institute for Microengineering and Microsystems

About

M. Stopka is an author at University of Kassel specializing in engineering, applied physics, and microscopy.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	8	8	224
2	Applied Physics	6	6	156
3	Medicine	2	2	58
4	Materials Engineering	2	2	68
5	Electrical Engineering	1	1	53

M. Stopka

Publications

224

Citations

H-Index

Page 1

	Year	Citations
Micromachined fabrication of Si cantilevers with Schottky diodes integrated in the tip T. Leinhos, M. Stopka, E. Oesterschulze Applied Physics A Electrical EngineeringWafer Scale ProcessingEngineeringMicromachinesMicrofabrication	1998	53
Thermal imaging of thin films by scanning thermal microscope E. Oesterschulze, M. Stopka, Lars Ackermann, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena EngineeringMicroscopyThermal ConductivityOptical PropertiesThermal Microscope	1996	53
Surface investigations by scanning thermal microscopy M. Stopka, Lubomir M. Hadjiiski, E. Oesterschulze, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena EngineeringMicroscopySurface InvestigationsThermal MicroscopeFeedback Loop	1995	35
Coaxial probes for scanning near‐field microscopy T. Leinhos, O. Rudow, M. Stopka, Journal of Microscopy Coaxial ProbesCantilever ProbeEngineeringMicroscopyMicrofabrication	1999	23
Photo-thermal characterization of solids and thin films by optical and scanning probe techniques E. Oesterschulze, M. Stopka, Rainer Kassing Microelectronic Engineering Materials ScienceOptical MaterialsEngineeringPhoto-thermal CharacterizationOptical Properties	1994	15
Photothermal imaging by scanning thermal microscopy E. Oesterschulze, M. Stopka Journal of Vacuum Science & Technology A Vacuum Surfaces and Films EngineeringMicroscopyMicroscopy MethodThermal AnalysisThermodynamics	1996	15
Multifunctional AFM/SNOM cantilever probes: Fabrication and measurements M. Stopka, D. Drews, Karsten Mayr, Microelectronic Engineering Materials ScienceEngineeringMicroscopyMicrofabricationMechanical Engineering	2000	15
Photothermal scanning near-field microscopy M. Stopka, E. Oesterschulze, Jürgen Schulte, Materials Science and Engineering B EngineeringPhysicsMicroscopyMicroscopy MethodApplied Physics	1994	15

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