Yi-Shing Chang

Analysis of ground bounce in deep sub-micron circuits

Yi-Shing Chang, Sidharth Gupta, M.A. Breuer · 2002 · 118 citations

Engineering, Computer Engineering, Electrical Engineering +10

On modeling crosstalk faults

Sandip Kundu, S.T. Zachariah, Yi-Shing Chang et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2005 · 58 citations

Engineering, Computer Engineering, Electrical Engineering +15

A modeling approach for addressing power supply switching noise related failures of integrated circuits

C. Tirumurti, Sandip Kundu, Susmita Sur‐Kolay et al. · Proceedings Design, Automation and Test in Europe Conference and Exhibition · 2004 · 52 citations

Engineering, Computer Engineering, Electrical Engineering +17

A Study of Implication Based Pseudo Functional Testing

M. Syal, Kameshwar Chandrasekar, Vishnu C. Vimjam et al. · Proceedings/Proceedings - International Test Conference · 2006 · 37 citations

Engineering, Computer Engineering, Computer Science +16

Test generation for ground bounce in internal logic circuitry

Yi-Shing Chang, Sandeep K. Gupta, M.A. Breuer · 2003 · 28 citations

Engineering, Computer Engineering, Electrical Engineering +17