Chris Sparks

Growth mechanism of TiN film on dielectric films and the effects on the work function

K. Choi, Patrick Lysaght, Husam N. Alshareef et al. · Thin Solid Films · 2005 · 40 citations

Natural Sciences, Materials Engineering, Materials Science +17

Picoliter solution deposition for total reflection X-ray fluorescence analysis of semiconductor samples

Chris Sparks, Ursula E. A. Fittschen, George J. Havrilla · Spectrochimica Acta Part B Atomic Spectroscopy · 2010 · 36 citations

Natural Sciences, Chemistry, Materials Science +12

Standards for low values of direct capacitance

Charles Moon, Chris Sparks · Journal of research of the National Bureau of Standards · 1948 · 33 citations · Full text

Engineering, Electrical Engineering, Instrumentation +14

SIMS depth profiling of advanced gate dielectric materials

J. Bennett, Carolyn Gondran, Chris Sparks et al. · Applied Surface Science · 2002 · 20 citations

Engineering, Electrical Engineering, Materials Science +14

Automated nanoliter solution deposition for total reflection X-ray fluorescence analysis of semiconductor samples

Chris Sparks, Carolyn H. Gondran, George J. Havrilla et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 2006 · 16 citations

Natural Sciences, Chemistry, Materials Science +15