David Boldridge

Analysis of Large Particle Count in Fumed Silica Slurries and Its Correlation with Scratch Defects Generated by CMP

Edward E. Remsen, Sriram Anjur, David Boldridge et al. · Journal of The Electrochemical Society · 2006 · 78 citations

Engineering, Chemical Engineering, Materials Engineering +16

Brittle and Ductile Fracture Mechanics Analysis of Surface Damage Caused During CMP

Terry A. Ring, Paul Feeney, David Boldridge et al. · Journal of The Electrochemical Society · 2007 · 50 citations

Engineering, Materials Engineering, Materials Science +17

Shear thickening of chemical mechanical polishing slurries under high shear

Nathan C. Crawford, S. Kim Ratanathanawongs Williams, David Boldridge et al. · Rheologica Acta · 2012 · 43 citations

Engineering, Chemical Engineering, Materials Science +13

Morphological Characterization of Fumed Silica Aggregates

David Boldridge · Aerosol Science and Technology · 2010 · 42 citations

Natural Sciences, Materials Engineering, Materials Science +13

Shear thickening and defect formation of fumed silica CMP slurries

Nathan C. Crawford, S. Kim Ratanathanawongs Williams, David Boldridge et al. · Colloids and Surfaces A Physicochemical and Engineering Aspects · 2013 · 40 citations

Engineering, Chemical Engineering, Mineral Processing +12