Wing Sy

Characterization of SRAM sense amplifier input offset for yield prediction in 28nm CMOS

Mohamed H. Abu-Rahma, Ying Chen, Wing Sy et al. · 2011 · 44 citations

Electrical Engineering, Sram Yield, Engineering +13

Characterization and Modeling of Flicker Noise in FinFETs at Advanced Technology Node

Pragya Kushwaha, Harshit Agarwal, Yen-Kai Lin et al. · IEEE Electron Device Letters · 2019 · 43 citations

Device Modeling, Electrical Engineering, Engineering +15

RF and mixed-signal performances of a low cost 28nm low-power CMOS technology for wireless system-on-chip applications

Ming‐Ta Yang, Ken Liao, Robert Welstand et al. · Symposium on VLSI Technology · 2011 · 19 citations

Wireless Communications, Low-power Cmos Technology, Engineering +17

Non-Gaussian distribution of SRAM read current and design impact to low power memory using Voltage Acceleration Method

Joseph Wang, Ping Liu, Yandong Gao et al. · Symposium on VLSI Technology · 2011 · 10 citations

Hardware Security, Non-volatile Memory, Electrical Engineering +13