Mohamed H. Abu-Rahma

A Statistical Design-Oriented Delay Variation Model Accounting for Within-Die Variations

Mohamed H. Abu-Rahma, Mohab Anis · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2008 · 50 citations

Engineering, Vlsi Design, Advanced Nanometer Cmos +17

Characterization of SRAM sense amplifier input offset for yield prediction in 28nm CMOS

Mohamed H. Abu-Rahma, Ying Chen, Wing Sy et al. · 2011 · 44 citations

Electrical Engineering, Sram Yield, Engineering +13

FinFET SRAM Optimization With Fin Thickness and Surface Orientation

Mingu Kang, S. C. Song, Seonghoon Woo et al. · IEEE Transactions on Electron Devices · 2010 · 35 citations

Device Modeling, Electrical Engineering, Finfet Sram +10

A methodology for statistical estimation of read access yield in SRAMs

Mohamed H. Abu-Rahma, Kinshuk Chowdhury, Joseph Wang et al. · 2008 · 32 citations

Non-volatile Memory, Engineering, Vlsi Design +17

Variability in VLSI Circuits: Sources and Design Considerations

Mohamed H. Abu-Rahma, Mohab Anis · 2007 · 27 citations

Process Variations, Electrical Engineering, Physical Design (Electronics) +15